Email this Article Email   

CHIPS Articles: Exploring the Dimensions of Trustworthiness

Exploring the Dimensions of Trustworthiness
Register now for the workshop on Trustworthiness in Cyber-Physical Systems and the IoT, to be held Aug. 30-31 at the NIST Gaithersburg, Maryland campus
By NIST News - August 18, 2016
Trustworthiness is a critical concern stakeholders have about Cyber-Physical Systems (CPS) and the internet of things (IoT) and their deployment. The National Institute of Standards and Technology's Smart Grid and Cyber-Physical Systems Program Office released its CPS Framework in May 2016 and, there, trustworthiness is captured as a high-level concern encompassing safety, security, privacy, resilience, and reliability.

While there are many efforts, in multiple sectors, to study these characteristics of systems they are typically considered separately and in isolation. This can result in work, intended to address one of these concerns, adversely impacting work to address one or more of the others. Thus CPS/IoT trustworthiness relies on an integrated, concern-driven approach that takes into account the interactions between the cyber and physical elements of systems.

This workshop will convene thought leaders from industry, academia, and government with expertise in engineering, physical, and information sciences to examine the measurement challenges and opportunities for progress surrounding new concepts for trustworthiness to CPS and Internet of Things (IoT) applications. Presentations and discussion sessions will focus on the integration of approaches from safety, security, resilience, reliability, and privacy engineering to the conceptualization, realization, and assurance of safe, secure, and effective CPS and IoT systems. Join us and contribute your ideas for trustworthy solutions linking the digital and physical worlds.

Online registration is required. Registration closes on August 23, 2016. All attendees must be pre-registered to gain entry to the NIST campus. Photo identification must be presented at the main gate to be admitted to the conference. International attendees are required to present a passport. Attendees must wear their conference badge at all times while on the campus. There is no on-site registration for meetings held at NIST.

The National Institute of Standards and Technology (NIST) is an agency of the U.S. Department of Commerce.

Related CHIPS Articles
Related DON CIO News
Related DON CIO Policy
CHIPS is an official U.S. Navy website sponsored by the Department of the Navy (DON) Chief Information Officer, the Department of Defense Enterprise Software Initiative (ESI) and the DON's ESI Software Product Manager Team at Space and Naval Warfare Systems Center Pacific.

Online ISSN 2154-1779; Print ISSN 1047-9988